4.8 Article

Scalable manufacture of verticalp-GaN/n-SnO2heterostructure for self-powered ultraviolet photodetector, solar cell and dual-color light emitting diode

Journal

INFOMAT
Volume 3, Issue 5, Pages 598-610

Publisher

WILEY
DOI: 10.1002/inf2.12127

Keywords

heterostructure; light emitting diode; self-powered; solar cell; UV photodetector

Funding

  1. National Natural Science Foundation of China [61705043]
  2. Natural Science Foundation of Jiangsu Province [BK20160568]
  3. Science and Technology Commission of Shanghai Municipality, Shanghai Sailing Program [19YF1433300]
  4. Startup Fund of ShanghaiTech University

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This study utilized p-type GaN:Mg and n-type SnO(2) to fabricate a p-n heterojunction for applications in solar cells, dual-color light emitting diodes, and high-speed ultraviolet photodetectors, achieving an external quantum efficiency of up to 74%.
Vertical SnO(2)basedp-njunctions are pivotal since they built the core components in photoelectronic systems. Nevertheless, preparation of high-qualityp-SnO(2)with controllable hole mobility and concentration is still a great challenge owing to the self-compensating effect and lattice distortion caused by the radius discrepancy between host and doped atoms. Herein,ptype GaN:Mg grown by metal organic chemical vapor deposition is employed as hole transportation layer to constructp-nheterojunction with intrinsicn-SnO(2)prepared by atomic layer deposition. Both material preparation techniques are compatible with current industrial mass production processes. Thep-GaN/n-SnO(2)heterojunction can be developed as solar cell, dual-color light emitting diode and self-powered, high speed ultraviolet (UV) photodetector with external quantum efficiency of 74% at 0 V bias voltage. In addition, direct recombination of donor bound excitons ((DX)-X-0) and UV emission red shifts caused by quantum confinement Stack effect are observed in SnO2. Since our device fabrication technique is a standard craft in photoelectronics, the study ofp-GaN/n-SnO(2)heterojunction suggests a simple and effective strategy for large scale device integration in next generation high performance photoelectronic devices.

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