Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 70, Issue -, Pages -Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2020.3040834
Keywords
Additive manufacture (AM); calibration; liftoff dielectric resonator (LODR); surface resistance
Funding
- Engineering and Physical Sciences Research Council (EPSRC) via its iCASE Award
- Renishaw Plc
- EPSRC [1912817] Funding Source: UKRI
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A new method for accurately measuring the microwave surface resistance of flat metal plates is proposed and experimentally verified using a sapphire dielectric resonator. System losses are taken into account by continuously and controlled varying the distance between the dielectric and the sample under test.
A new method for accurate measurement of the microwave surface resistance of flat metal plates is proposed and verified experimentally, based on a sapphire dielectric resonator. System losses are accounted for by having continuous and controlled variation of the distance between the dielectric and the sample under test.
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