Percolation threshold of curved linear objects

In this study, we investigate the percolation threshold of curved linear objects, describing them as quadratic Bezier curves. Using Monte Carlo simulations, we calculate the critical number densities of the curves with different curviness. We also obtain the excluded area of the curves. When an excluded area is given, we can find the critical number density of the curves with arbitrary curviness. Apparent conductivity exponents are computed for the curves, and these values are found to be analogous to that of sticks in the percolative region for a junction resistance dominant system. These results can be used to analyze the optoelectrical performance of metal nanowire films because the high-aspect-ratio metal nanowires can be easily curved during coating.

Automated summary

This study investigates the percolation threshold of curved linear objects, represented as quadratic Bezier curves. By utilizing Monte Carlo simulations, critical number densities of the curves with varying curviness were calculated, along with the excluded area. Apparent conductivity exponents were computed, showing similarities with sticks in percolative systems, providing insights for analyzing the optoelectrical performance of metal nanowire films.