Carbide-Derived Carbons: WAXS and Raman Spectra for Detailed Structural Analysis

Quick characterization methods to determine the structure of carbon materials are sought after for a wide array of technical applications. In this study we present the combined analysis of the structure of carbide-derived carbons (CDCs) with Raman spectroscopy and wide-angle X-ray scattering (WAXS) methods. We present the optimal deconvolution method to be used for the detailed analysis of Raman spectroscopy data of CDCs and comparison to corresponding WAXS results is made. For a broad set of CDCs both WAXS and Raman spectroscopy data showed that the average graphene layer extent increases with synthesis temperature of CDC, while the coherent domain lengths obtained from Raman spectroscopy higher by an average of 4.4 nm. In addition, the presence of correlations between the parameters (D-band width and the parameter A(Sigma)D/A(Sigma)G ) from Raman spectroscopy and the synthesis temperature are established. Based on the WAXS and Raman spectra data analysis the strong influence of the precursor carbide structure on the graphitization pathway is shown.

Automated summary

Characterization methods, such as Raman spectroscopy and wide-angle X-ray scattering, are used to analyze the structure of carbon materials, with findings indicating an increase in the average graphene layer extent with synthesis temperature of carbide-derived carbons. Correlations between parameters from Raman spectroscopy and synthesis temperature are established, showing a strong influence of precursor carbide structure on the graphitization pathway.