In situ XPS investigation of the X-ray-triggered decomposition of perovskites in ultrahigh vacuum condition

X-ray photoelectron spectroscopy (XPS) has been used to investigate the composition of perovskite films upon exposure to different environmental factors, such as moisture, heat, and UV light. However, few research studies have determined that the X-ray itself could cause damage to the perovskite crystals. In this study, the X-ray-induced degradation of CH3NH3PbI3 perovskite films was investigated via XPS within an in situ ultrahigh vacuum system. It is demonstrated that fresh methylammonium lead iodine contains Pb2+ without the initial existence of Pb-0. The Pb-0 signal was discovered after a few hours of soft X-ray exposure, which indicates that the CH3NH3PbI3 perovskite structure undergoes a decomposition process to form metallic Pb. In addition, the nitrogen content was found to be significantly decreasing in the first hour of X-ray exposure. The discovery of the X-ray-induced chemical state change and the volatile methylamine of perovskite crystals could be further applied as an indicator for the field of X-ray sensors or detectors.

Automated summary

The study found that X-ray can induce degradation of CH3NH3PbI3 perovskite films, resulting in the formation of metallic lead, and a significant decrease in nitrogen content within the first hour of X-ray exposure. This discovery could have applications in the field of X-ray sensors or detectors.