Journal
MATTER
Volume 4, Issue 2, Pages 441-460Publisher
CELL PRESS
DOI: 10.1016/j.matt.2020.10.025
Keywords
-
Categories
Funding
- Brazilian agency Fundacao de Amparo a Pesquisa do Estado de Sao Paulo -FAPESP [2018/05159-1, 2013/07296-2, 2017/18139-6, 2017/02317-2]
- Brazilian agency Conselho Nacional de Desenvolvimento Cienti'fico e Tecnologico -CNPq (INCT-Carbono)
Ask authors/readers for more resources
Atomic-scale structure determination is crucial for nanomaterial understanding and new technology development. Electron diffraction offers advantages for atomic structure characterization, with potential to become a routine tool in nanomaterial science.
Atomic-scale structure determination is crucial to the understanding of nanomaterial properties and development of new technologies. Although pair distribution function (PDF) analysis by neutrons and X-ray scattering profile has been used to study materials, electron diffraction can offer advantages to characterize the atomic structure of clusters, amorphous samples, and nanomaterials. Electrons have higher scattering power than X-rays, allowing the acquirement of PDF from electron diffraction (ePDF) for small sample amounts and with time-efficient data acquisition. Compared with synchrotron X-rays and neutrons as sources for PDF, the availability of electron microscopes worldwide is advantageous. Nowadays, with the rise of methodologies and specific software for ePDF data analysis, the scientific community can benefit from advanced transmission electron microscopy (TEM) structure determination integrating commonly available TEM analyses?size, distribution, shape, and high-resolution TEM atomic visualization? with ePDF atomic structure determination, both for bulk and surface configurations. Therefore, ePDF has the potential to become a routine and advanced characterization tool for nanomaterials science.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available