4.8 Article

Superior and stable ferroelectric properties of hafnium-zirconium-oxide thin films deposited via atomic layer deposition using cyclopentadienyl-based precursors without annealing

Journal

NANOSCALE
Volume 13, Issue 18, Pages 8524-8530

Publisher

ROYAL SOC CHEMISTRY
DOI: 10.1039/d1nr01535d

Keywords

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Funding

  1. National Research Foundation of Korea (NRF) - Korea government (MSIP) [2019R1C1C1002982, 2020M3F3A2A01081240]
  2. Industrial Strategic Technology Development Program - Ministry of Trade, Industry and Energy (MOTIE, Korea) [20006492]
  3. Hanyang University [HY-2020-2469]
  4. Korea Evaluation Institute of Industrial Technology (KEIT) [20006492] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
  5. National Research Foundation of Korea [2020M3F3A2A01081240] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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Ferroelectric thin films based on ALD technology have been extensively studied as promising candidates for next-generation devices. By using a cyclopentadienyl-based precursor, Hf-Zr-O thin films can exhibit excellent ferroelectric properties without the need for additional post-thermal processing. This new strategy opens up possibilities for ferroelectric devices with specific processing temperature constraints.
HfO2-based ferroelectric thin films deposited via atomic layer deposition have been extensively studied as promising candidates for next-generation ferroelectric devices. The conversion of an amorphous Hf1-xZrxO2 film to the ferroelectric phase (non-centrosymmetric orthorhombic phase) has been achieved through annealing using a post-thermal process. However, in this study, we present the first report of ferroelectricity of hafnium-zirconium-oxide (HZO) thin films deposited via atomic layer deposition using cyclopentadienyl-based precursors without additional post-thermal processing. By increasing the deposition temperature using a cyclopentadienyl-based cocktail precursor, the conditions of the as-deposited HZO thin film to crystallize well with an orthorhombic phase were secured, and excellent ferroelectric properties with a large remanent polarization (2P(r) similar to 47.6 mu C cm(-2)) were implemented without crystallization annealing. The as-deposited HZO thin film possessed very stable ferroelectric properties without a wake-up effect or significant fatigue up to 10(6) cycles. Futhermore, we demonstrated the applicability to devices using negative capacitance and non-volatile memory characteristics. This result suggests that a new strategy can be applied to ferroelectric devices where subsequent processing temperature constraints are required, such as back-end-of-line processes and ferroelectric-based flexible device applications.

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