4.6 Article

Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe

Journal

PHYSICAL REVIEW B
Volume 103, Issue 11, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.103.115127

Keywords

-

Funding

  1. National Key R&D program of China [2017YFA0305400, 2018YFA0307000]
  2. National Natural Science Foundation of China [11774190, 11874022, 11604207]
  3. U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-76SF00515]
  4. Advanced Light Source, a U.S. DOE Office of Science User Facility [DE-AC02-05CH11231]

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The research investigates the electronic structure and surface reconstruction of Cu2-xTe, proposing that the surface reconstruction is caused by the distributed deficiency of liquidlike Cu ions.
Recently, layered copper chalcogenides Cu2X family (X = S, Se, Te) has attracted tremendous research interests due to their high thermoelectric performance, which is partly due to the superionic behavior of mobile Cu ions, making these compounds phonon liquids. Here, we systematically investigate the electronic structure and its temperature evolution of the less studied single crystal Cu2-xTe by the combination of angle resolved photoemission spectroscopy (ARPES) and scanning tunneling microscope/spectroscopy (STM/STS) experiments. While the band structure of the Cu2-xTe shows agreement with the calculations, we clearly observe a 2 x 2 surface reconstruction from both our low temperature ARPES and STM/STS experiments which survives up to room temperature. Interestingly, our low temperature STM experiments further reveal multiple types of reconstruction patterns, which suggests the origin of the surface reconstruction being the distributed deficiency of liquidlike Cu ions. Our findings reveal the electronic structure and impurity level of Cu-2 Te, which provides knowledge about its thermoelectric properties from the electronic degree of freedom.

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