4.6 Article

Allan Deviation of Atomic Clock Frequency Corrections: A New Diagnostic Tool for Characterizing Clock Disturbances

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TUFFC.2021.3061005

Keywords

Synthesizers; Frequency measurement; Frequency control; Frequency synthesizers; Resonant frequency; Ions; Atomic clocks; Allan deviation (ADEV); atomic clock; Deep Space Atomic Clock (DSAC); environmental disturbances; frequency control; ion frequency standard; shot noise; ultrastable oscillator (USO)

Funding

  1. internal Research and Technology Development program

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This article discusses the impact of local oscillators on the output of atomic clocks and how corrections through a control algorithm can optimize clock performance. By analyzing the Allan deviation of the output frequency, disturbances observed on the clock output can be diagnosed, with the corrections-ADEV used as a diagnostic tool.
As atomic clocks and frequency standards are increasingly operated in situations where they are exposed to environmental disturbances, it becomes more necessary to understand how variations of each clock component impact the clock output, in particular the local oscillator (LO). Most microwave atomic clocks in operation today use quartz crystal LOs with excellent short-term noise variation but large unwanted long-term drift. Fortunately, this slow drift is mitigated by repeatedly comparing the atomic reference frequency to the LO and applying corrections each iteration through a control algorithm. This article focuses on the shot-to-shot corrections themselves. To optimize clock performance, it is important to determine whether disturbances on the output are due to variations of the LO that the control loop failed to remove or variations of the reference frequency itself. Some of this can be diagnosed using the output frequency's Allan deviation (ADEV), the traditional measure of clock performance. However, the ADEV of the corrections reveals somewhat different information, specifically more direct information about all disturbances that the measurement system detects and compensates for, from the LO or elsewhere. In this article: we 1) derive the baseline shot-noise-limited noise floor for this ADEV, 2) validate and adjust for the complexities of our control loop with a computer model, and 3) examine model results and laboratory data that lie on or diverge from the noise floor to understand what divergences reveal about LO and/or clock behavior. Ultimately, we show how to use this corrections-ADEV as a diagnostic to help identify the source of disturbances and drift observed on the clock output.

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