4.6 Article

Improved Ink-Jet-Printed CdSe Quantum Dot Light-Emitting Diodes with Minimized Hole Transport Layer Erosion

Journal

ACS APPLIED ELECTRONIC MATERIALS
Volume 3, Issue 7, Pages 3005-3014

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsaelm.1c00210

Keywords

ink-jet printing; annealing process; hole transporting layer; erosion; QLED; stability

Funding

  1. Ministry of Science and Technology of China [2016YFB0401702, 2017YFE0120400]
  2. National Natural Science Foundation of China [61674074, 61875082, 61405089]
  3. Guangdong Province's Key R&D Program: Micro-LED Display and Ultra-high Brightness Micro-display Technology [2019B010925001]
  4. Environmentally Friendly Quantum Dots Luminescent Materials [2019B010924001]
  5. Guangdong Basic and Applied Basic Research Foundation [2019A1515110437]
  6. Guangdong University Key Laboratory for Advanced Quantum Dot Displays [2017KSYS007]
  7. Shenzhen Innovation Project [JCYJ20180305180629908]
  8. Guangdong Youth Innovative Talents Project [2018KQNCX228]
  9. Shenzhen Peacock Team Project [KQTD2016030111203005]

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It was found that ink-jet printed QLEDs using quantum dot ink could erode the hole transport layer, resulting in rough surface morphology and decreased device performance. By optimizing the annealing process of the hole transport layer, a smooth surface with fewer defects can be achieved, improving device performance and lifetime.
Ink-jet printing is a promising deposition technology, which is capable of large-area fabrication and mask-free patterning. For ink-jet-printed quantum dot (QD) light-emitting diodes (LEDs), the QDs are commonly dissolved in a mixture of solvent and thickener ink system. However, the hole transport layer could be eroded by this QD ink, leading to a rough surface morphology and resulting in the leakage of carriers and low device performance. This phenomenon was first and directly observed by using an atomic force microscope and a cross-sectional scanning electron microscope. We, therefore, redesigned the annealing process of the hole transport layer to achieve an optimized smooth surface with a reduced number of defects for ink-jet-printed QD LEDs (QLEDs). Optimized morphology brings back a maximum luminance of over 30,000 cd/m(2) and an external quantum efficiency of 7.52% for the ink-jet-printed red QLEDs using CdSe QDs, which are comparable to those of the spin-coated device. Moreover, the operation lifetime of the ink-jet-printed device is also enhanced by the restored surface morphology. An enhanced T-50 lifetime of the ink-jet-printed device at 1000 cd/m(2) is improved from 26 to 127 h, which converted to a long T-50 lifetime of 8013 h, when operated at 100 cd/m(2).

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