Time-resolved shot-by-shot photoelectron spectroscopy of autoionizing Xe+ states by EUV-free-electron-laser and near-IR laser pulses

Ultrafast dynamics of highly excited Rydberg states of Xe+ is investigated by time-resolved shot-by-shot photoelectron spectroscopy with EUV-free-electron-laser pump (40.8 eV) and near-infrared probe (1.56 eV) pulses. Sorting the single-shot spectra in the order of relative delay between the two pulses allows for investigating ultrafast decays of intermediate states participating in the double ionization of Xe. Observed photoelectron spectra show a biexponential decay within similar to 100 fs and similar to 300 ps in addition to constant signals lasting longer than 1 ns. These ultrafast decays reflect the lifetimes of autoionizing Rydberg states converging to electronically excited states of Xe2+. The results demonstrate that time-resolved shot-by-shot EUV-free-electron-laser photoelectron spectroscopywith a synchronized optical laser provides a powerful tool for investigating ultrafast electron emission processes.

Automated summary

The ultrafast dynamics of highly excited Rydberg states of Xe+ were investigated using time-resolved shot-by-shot photoelectron spectroscopy with EUV-free-electron-laser pump and near-infrared probe pulses. The results showed that this technique is a powerful tool for studying ultrafast electron emission processes, reflecting the lifetimes of autoionizing Rydberg states.