Quantitative annular dark-field imaging in the scanning transmission electron microscope-a review

This article provides a review of quantitative annular dark-field imaging in the scanning transmission electron microscope, paying particular attention to the methods of image quantification, and the application of quantitative data, including the use of density functional theory calculations, to relate the properties of nanomaterials to atomic-level structure.

Automated summary

This article provides a comprehensive overview of quantitative annular dark-field imaging in scanning transmission electron microscope, focusing on image quantification methods and the application of quantitative data, such as density functional theory calculations, to correlate nanomaterial properties with atomic-level structure.