Journal
EUROPEAN PHYSICAL JOURNAL PLUS
Volume 136, Issue 8, Pages -Publisher
SPRINGER HEIDELBERG
DOI: 10.1140/epjp/s13360-021-01837-7
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A size-dependent Bernoulli-Euler beam model for buckling analysis of piezoelectric nanobeams considering flexoelectricity influence is presented, utilizing stress-driven nonlocal theory to capture size effects. The nanobeams are assumed to be embedded in an elastic medium, and governing equations including nonlocal and flexoelectricity effects are obtained using a variational approach. The study also proposes a numerical solution approach for calculating buckling loads of piezoelectric nanobeams with different boundary conditions, and investigates the effects of flexoelectricity, nanoscale, and elastic foundation on buckling behavior through numerical examples.
Presented herein is a size-dependent Bernoulli-Euler beam model for the buckling analysis of piezoelectric nanobeams under electrical loading with the consideration of flexoelectricity influence. In order to capture size effects, the stress-driven model of nonlocal theory is utilized. Moreover, it is considered that the nanobeams are embedded in an elastic medium. According to a variational approach, the governing equations including nonlocal and flexoelectricity effects are obtained. Also, using the generalized differential quadrature technique, a numerical solution approach is proposed for calculating buckling loads of piezoelectric nanobeams with different boundary conditions. The effects of flexoelectricity, nanoscale and elastic foundation on the buckling behavior of nanobeams are studied through presenting some numerical examples.
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