4.6 Article

Conductivity-Type Conversion in Self-Assembled GeSn Stripes on Ge/Si(100) under Electric Field

Journal

ACS APPLIED ELECTRONIC MATERIALS
Volume 3, Issue 10, Pages 4388-4397

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsaelm.1c00561

Keywords

Ge-Sn alloys; Kelvin probe force microscopy; charge trapping; inversion layer; Sn segregation

Funding

  1. U.S. Civilian Research & Development Foundation (CRDF Global)
  2. Multidisciplinary University Research Initiative (MURI) Program through U.S. Air Force Office of Scientific Research (AFOSR) [FA9550-19-1-0341]
  3. NAS of Ukraine [24/21]
  4. Coordenacao de Aperfeicoamento de Pessoal de Nivel Superior - Brasil (CAPES) [001]

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The study focuses on the electronic properties of self-assembled Ge99Sn1 stripes surrounded by inhomogeneous Ge96.6Sn3.4 areas formed by the segregation and migration of Sn droplets on Ge89.5Sn10.5/Ge/Si(100). Nanoscale characterization of the microscale patterns using X-ray diffraction, Raman spectroscopy, and scanning probe microscopy revealed spatial inhomogeneity in work function, dominant p-type conductivity, and lateral variation in hole density by an order of magnitude. The experimental results show an electric-field-induced conductivity-type conversion from p to n in a self-assembled GeSn stripe, with a proposed model and calculations supporting the observed phenomena.
We report on the electronic properties of self-assembled Ge99Sn1 stripes surrounded by inhomogeneous Ge96.6Sn3.4 area resulting from the segregation and migration of Sn droplets on Ge89.5Sn10.5/Ge/Si(100). The sample with microscale patterns was characterized at the nanoscale by a combination of techniques including X-ray diffraction, Raman spectroscopy, and scanning probe microscopy. Kelvin probe force microscopy (KPFM) nanoscale maps of the local work function show a spatial inhomogeneity up to 200 meV, which is explained by the band bending induced by holes trapped at the surface states of the Sn droplets. The scanning capacitance microscopy (SCM) of the local charge carrier density shows the dominant p-type conductivity with lateral variation in the hole-density by 1 order of magnitude. The microscale patterns are depleted by holes, and we experimentally revealed an electric-field-induced conductivity-type conversion from p to n in a self-assembled GeSn stripe. Finally, we presented a model and calculations that support the described above experimentally observed phenomena. This work explicitly provides an understanding of the electronic properties of the GeSn micrometer-scale stripes that is important for the implementation of the GeSn in photonic, optoelectronic, electronic, and energy storage devices.

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