Autoregression and Structured Low-Rank Modeling of Sinogram Neighborhoods

Sinograms are commonly used to represent the raw data from tomographic imaging experiments. Although it is already well-known that sinograms posess some amount of redundancy, in this work, we present novel theory suggesting that sinograms will often possess substantial additional redundancies that have not been explicitly exploited by previous methods. Specifically, we derive that sinograms will often satisfy multiple simple data-dependent autoregression relationships. This kind of autoregressive structure enables missing/degraded sinogram samples to be linearly predicted using a simple shift-invariant linear combination of neighboring samples. Our theory also further implies that if sinogram samples are assembled into a structured Hankel/Toeplitz matrix, then the matrix will be expected to have low-rank characteristics. As a result, sinogram restoration problems can be formulated as structured low-rank matrix recovery problems. Illustrations of this approach are provided using several different (real and simulated) X-ray imaging datasets, including comparisons against a state-of-the-art deep learning approach. Results suggest that structured low-rank matrix methods for sinogram recovery can have comparable performance to state-of-the-art approaches. Although our evaluation focuses on competitive comparisons against other approaches, we believe that autoregressive constraints are actually complementary to existing approaches with strong potential synergies.

Automated summary

This study presents a novel theory suggesting that sinograms often possess substantial redundancies that can be used for linear prediction of missing/degraded samples. Additionally, when sinogram samples are assembled into a structured Hankel/Toeplitz matrix, the matrix is expected to have low-rank characteristics.