4.7 Article

A Robust System for Thermoelectric Device Characterization

Journal

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2021.3115213

Keywords

Electrical conductivity; figure of merit; Seebeck coefficient; systematic errors; thermal conductivity; thermoelectric device characterization

Funding

  1. FAPEMIG
  2. CNPq
  3. CAPES

Ask authors/readers for more resources

Due to the rising cost of energy and the continuous development of thermoelectric materials, a new system for characterizing thermoelectric generation devices has been proposed, which can significantly reduce errors and costs.
Due to the large reduction in fossil fuel reservoirs, the consequent cost increase of deepwater extraction, and the emission of pollutants, there is a constant search for alternative ways to obtain clean energy at a lower cost. Among those sources, we focus on the energy produced by thermoelectric materials. In this work, we present a new system for the characterization of thermoelectric generation devices. Such a system performs measurements of electrical resistivity, Seebeck coefficient, and thermal conductivity in a single setup. With this, it is possible to reduce the systematic errors in the figure of merit ZT and the cost of the equipment. Our equipment, together with the developed software, presented excellent results and analyses, and with that, it proves to be a robust alternative for the characterization of commercial thermoelectric devices, and of laboratory thin film thermoelectric materials.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.7
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available