Journal
IEEE 71ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2021)
Volume -, Issue -, Pages 1505-1513Publisher
IEEE COMPUTER SOC
DOI: 10.1109/ECTC32696.2021.00239
Keywords
Warpage; cure shrinkage; viscoelastic properties; transfer molding; compression molding
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This paper discusses the simulation of electronic packages using advanced computational mechanics techniques and commercial tools, as well as the challenges in accurately predicting warpage and the steps that should be taken to improve prediction capability.
With advanced computational mechanics techniques and computing hardware, one can simulate almost any kind of electronic packages. Thermo-mechanical properties required for numerical predictions, including the coefficient of thermal expansion (CTE), the glass transition temperature (Tg), the temperature and time-dependent viscoelastic properties, are routinely measured by commercial tools such as thermo-mechanical analyzer (TMA), dynamic mechanical analyzer (DMA) and universal testing apparatus. In addition, temperature-dependent warpage can be measured readily using commercial shadow Moire and digital image correlation (DIC) tools. In spite of the considerable effort devoted for warpage prediction, accurate prediction of warpage is still a challenging task. This paper addresses three main reasons why the prediction is still difficult, and discusses what should be done to bring the prediction capability to a desired level.
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