Journal
ENVIRONMENTAL SCIENCE AND POLLUTION RESEARCH
Volume 25, Issue 8, Pages 7638-7646Publisher
SPRINGER HEIDELBERG
DOI: 10.1007/s11356-017-1077-9
Keywords
Cadmium; Silicon; Wheat; Scanning ion-selective electrode technique; Oxidative stress; Antioxidant defense
Categories
Funding
- National Science Foundation of China [41571320]
- science and technology research projects of Henan Province [162102110127]
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Cadmium (Cd) is a toxic element that poses a great threat to human health, while silicon (Si) is a beneficial element and has been shown to have a mitigation effect on plants under Cd toxicity. However, the mechanisms underlying the role of Si in alleviating Cd toxicity are still poorly understood in wheat. Therefore, growth status, photosynthesis parameters, root morphology, antioxidant system, and Cd2+ uptake and flux under Cd toxicity were studied through hydroponic experiment, aiming to explore the mitigation of Si on Cd toxicity in wheat seedlings. The results showed that Si supply improved plant biomass as well as photosynthetic but had little effects on root morphology of seedlings under Cd stress. Si addition decreased Cd contents both in shoots and roots. In situ measurements of Cd2+ flux showed that Si significantly inhibited the net Cd2+ influx in roots of wheat. Si also mitigated the oxidative stress in wheat leaves by decreasing malondialdialdehyde (MDA) and hydrogen peroxide (H2O2) contents as well as by increasing superoxide dismutase (SOD) and guaiacol peroxidase (POD) activity. Overall, the results revealed that Si could alleviate Cd toxicity in wheat seedlings by improving plant growth and antioxidant capacity and by decreasing Cd uptake and lipid peroxidation.
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