Journal
2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
Volume -, Issue -, Pages -Publisher
IEEE
DOI: 10.1109/IEDM19574.2021.9720605
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A new generation of scalable photon counting image sensors with zero read noise and 100ps temporal resolution has been introduced. This technology utilizes a charge focusing single-photon avalanche diode to address critical trade-offs in conventional SPAD pixels, achieving superior performance in photon detection efficiency, dark count rate, and timing jitter. The prototype image sensor demonstrates the best-in-class characteristics with the largest array size reported in APD-based image sensors, paving the way for compact and high-definition photon counting sensors for low-light imaging and 3D time-of-flight sensing.
We present a new generation of scalable photon counting image sensors, featuring zero read noise and 100ps temporal resolution. Newly proposed charge focusing single-photon avalanche diode (SPAD) is employed to resolve critical trade-offs in conventional SPAD pixels. A prototype 3.2 megapixel 3D-stacked backside-illuminated (BSI) image sensor with 1-inch format demonstrates the best-in-class photon detection efficiency (PDE), dark count rate (DCR) and timing jitter performance with the largest array size ever reported in avalanche photodiode (APD)-based image sensors. The proposed technology paves the way to compact and high-definition photon counting image sensors for low-light imaging and 3D time-of-flight sensing.
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