Journal
DEVELOPMENTS IN X-RAY TOMOGRAPHY XIII
Volume 11840, Issue -, Pages -Publisher
SPIE-INT SOC OPTICAL ENGINEERING
DOI: 10.1117/12.2595498
Keywords
Computed tomography; Talbot effect; Lau interferometer; phase imaging; microscopy
Funding
- Japan Science and Technology Agency (JST) [JPMJER1403]
- JSPS KAKENHI [20H02628]
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In this study, a three-wave interference model is utilized to reduce artifacts in phase tomography, along with a proposed new method. The presentation demonstrates the reduction of artifacts in phase tomography through the results shown.
Phase imaging has a higher sensitivity for low-Z materials than the conventional absorption imaging. We have developed a high-resolution X-ray phase microscope in combination with a Lau interferometer and used it for phase tomography. However, the existing method cannot avoid artifacts originating from the assumption of a two-beam interference model. In this study, we use a three-wave interference model to reduce the artifacts and propose a new method to attain phase tomography. In the presentation, we will demonstrate the reduction of the artifacts with the results of phase tomography.
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