Journal
CHEMOSPHERE
Volume 293, Issue -, Pages -Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.chemosphere.2022.133604
Keywords
Deep learning; DenseNet; Spark-induced plasma spectroscopy; Fine dust; Source identification
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Funding
- Samsung Research
- National Research Foundation of Korea through IAAT at Seoul National University [NRF0498-20210020]
- National Research Foundation of Korea through IOER at Seoul National University [NRF0498-20210020]
- Samsung Elec-tronics Co., Ltd.
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Accurate identification and monitoring of fine dust is crucial, and a new technique called SIPS combined with deep learning can quickly and accurately identify the sources of fine dust.
Accurate identification and monitoring of fine dust are emerging as a primary global issue for addressing the harmful effects of fine dust on public health. Identifying the source of fine dust is indispensable for ensuring the human lifespan as well as preventing environmental disasters. Here a simple yet effective spark-induced plasma spectroscopy (SIPS) unit combined with deep learning for real-time classification is verified as a fast and precise PM (particulate matter) source identification technique. SIPS promises portable use, label-free detection, source identification, and chemical susceptibility in a single step with acceptable speed and accuracy. In particular, the densely connected convolutional networks (DenseNet) are used with measured spark-induced plasma emission datasets to identify PM sources at above 98%. The identification performance was compared with other common classification methods, and DenseNet with dropouts (30%), optimized batch size (16), and cyclic learning rate training emerged as the most promising source identification method.
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