Related references
Note: Only part of the references are listed.Wavelength-tuning interferometry with suppression of dispersive error
Sungtae Kim et al.
OPTIK (2021)
Performance Analysis of Surface Reconstruction Algorithms in Vertical Scanning Interferometry Based on Coherence Envelope Detection
Dongxu Wu et al.
MICROMACHINES (2021)
A high-precision automatic phase shifting algorithm with wavelength tuning
Shu Su et al.
24TH NATIONAL LASER CONFERENCE & FIFTEENTH NATIONAL CONFERENCE ON LASER TECHNOLOGY AND OPTOELECTRONICS (2020)
Surface profilometry of silicon wafers using wavelength-tuned phase-shifting interferometry
Fuqing Miao et al.
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY (2019)
Improvement of the fringe analysis algorithm for wavelength scanning interferometry based on filter parameter optimization
Tao Zhang et al.
APPLIED OPTICS (2018)
Snapshot multi-wavelength interference microscope
Xiaobo Tian et al.
OPTICS EXPRESS (2018)
Precise and fast phase wraps reduction in fringe projection profilometry
Minmin Wang et al.
JOURNAL OF MODERN OPTICS (2017)
Fundamental aspects of resolution and precision in vertical scanning white-light interferometry
Peter Lehmann et al.
SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES (2016)
Surface profile measurement of a highly reflective silicon wafer by phase-shifting interferometry
Yangjin Kim et al.
APPLIED OPTICS (2015)
Modelling water vapour permeability through atomic layer deposition coated photovoltaic barrier defects
Mohamed Elrawemi et al.
THIN SOLID FILMS (2014)
Fourier fringe analysis and its application to metrology of extreme physical phenomena: a review
Mitsuo Takeda
APPLIED OPTICS (2013)
Roll-to-Roll fabrication of large area functional organic materials
Roar R. Sondergaard et al.
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS (2013)
Comparison study of algorithms and accuracy in the wavelength scanning interferometry
Hussam Muhamedsalih et al.
APPLIED OPTICS (2012)
Surface and thickness measurement of a transparent film using wavelength scanning interferometry
Feng Gao et al.
OPTICS EXPRESS (2012)
Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise
Xiangqian Jiang et al.
APPLIED OPTICS (2010)
Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques
Sanjit K. Debnath et al.
OPTICS AND LASERS IN ENGINEERING (2009)
White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting
Maitreyee Roy et al.
OPTICS EXPRESS (2009)
The effect of windowing in Fourier transform profilometry applied to noisy images
F Berryman et al.
OPTICS AND LASERS IN ENGINEERING (2004)
Spectral interference Mirau microscope with an acousto-optic tunable filter for three-dimensional surface profilometry
DS Mehta et al.
APPLIED OPTICS (2003)
Determination of fringe order in white-light interference microscopy
P de Groot et al.
APPLIED OPTICS (2002)
Surface shape measurement by wavelength scanning interferometry using an electronically tuned Ti : sapphire laser
A Yamamoto et al.
OPTICAL REVIEW (2001)
Share Paper
