Journal
ACS APPLIED ELECTRONIC MATERIALS
Volume 4, Issue 2, Pages 614-621Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsaelm.1c00985
Keywords
organic thin-film transistor (OTFTs); organic semiconductor; charge transport; printed electronics; polymeric films; coffee-ring effect
Funding
- Natural Sciences and Engineering Research Council [STPGP-506891-2017]
- National Research Foundation of Korea (NRF) of the Nurturing Next-generation Researchers [NRF-2020R1A6A3A03038409]
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A method of controlling the carrier transport characteristics of inkjet-printed organic field-effect transistors (OFETs) by creating concentration gradients within the printed liquid volume was developed. The film formation and alignment of the printed transistor was influenced by the precise manipulation of the jetted droplets. This approach resulted in an enhancement of the field-effect mobility of the printed transistors.
An approach to control the carrier transport characteristics of inkjet-printed organic field-effect transistors (OFETs) was developed by creating concentration gradients within a printed volume of liquid. The gradients, established by precise and systematic spatial manipulation of the jetted droplets, were used to control the film formation of poly(3-hexylthiophene-2,5-diyl) (P3HT) to improve the carrier transport properties of the OFETs. The introduction of an internal lateral flux influenced the molecular alignment of the formed P3HT film. This alignment could be fixed parallel to the current flow direction in the device. The resulting printed P3HT-based transistors had an extracted field-effect mobility of 0.022 cm(2)/V.s, a 7 times enhancement compared to devices printed without a lateral flux. The off current for the printed devices ranged from 1 x 10(-8) to 2 x 10(-11) A with nominal threshold voltages <5 V. A simple geometric model was developed to describe how the control of the placement of the jetted droplets and the liquid volume over the device area may be used to affect film formation during the drying process. The model was used to predict and correlate the critical printing parameters to the thin-film structural profile and the observed device performance.
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