4.6 Article

Combined Role of Substrate and Doping on the Semiconductor-to-Metal Transition of VO2 Thin Films

Journal

ACS APPLIED ELECTRONIC MATERIALS
Volume 4, Issue 4, Pages 1841-1851

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsaelm.2c00080

Keywords

vanadium dioxide; smart materials; strain engineering; doping; phase transition; nanostructure

Funding

  1. Conseil de recherches en sciences naturelles et en genie du Canada
  2. Fonds quebecois de la recherche sur la nature et les technologies (Canada)

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Vanadium dioxide thin films doped with tungsten atoms and subjected to strain engineering exhibit a significant reduction in transition temperature, making them promising materials for electronic and energy devices. The combination of doping and strain allows for the interfacial effect to be utilized at any film thickness, resulting in a different film morphology and greatly reduced transition temperature. These tungsten-doped VO2 films show activation energies below 100 meV and a high electrical contrast, making them of strong interest for various devices.
Vanadium dioxide exhibits a sharp temperature-induced structural change (monoclinic to rutile) that induces a semiconductor-to-metal transition together with a major change in its electrical properties. Even though VO2 thin films are a promising candidate for numerous applications to electronic and energy devices, one of the greatest challenges toward integration of this material is to precisely control the transition temperature. Substrate-induced interfacial effects and dopant-induced isostatic stress combined with excess electron injection are the main paths used to reduce the temperature of transition. In this work, we combine metallic doping with tungsten atoms and strain engineering in VO2 thin films in order to lower the transition temperature while maintaining a high resistivity contrast. Epitaxial undoped films are shown to respond to substrate-induced strain by relaxing with increasing thickness but with a limited reduction of the transition temperature. In contrast, epitaxial doped films do not show any dependence on substrate-induced strain but yield a great reduction of the transition temperature as compared to polycrystalline relaxed doped films. This temperature shifts down to room temperature or even close to 0 degrees C depending on the doping level. This shift is accompanied by a different morphology of the film as compared to undoped films. In contrast to undoped VO2 where the substrate-induced effect is limited to very thin films, combining tungsten doping and substrate-induced strain allows one to take advantage of the interfacial effect at any film thickness. Moreover, activation energies below 100 meV and greatly reduced transition temperatures combined with an electrical contrast still above 2 orders of magnitude make tungsten-doped VO2 films of strong interest for many devices.

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