Imaging defects in two-dimensional crystals by convergent-beam electron diffraction

Convergent-beam electron diffraction (CBED), recently demonstrated on two-dimensional (2D) materials, of-fers a number of interesting applications such as imaging atomic in-and out-of plane shifts, interlayer distances, and individual adsorbates. In this study, we show how CBED allows for atomic-precision imaging of individual defects in 2D materials using one single-shot intensity measurement. In combination with structural calculations using density-functional theory, we present simulated CBED patterns for various defects in graphene, each of which exhibits a unique fingerprint distribution. We also show how atomic positions, including the individual atomic defects in graphene, can be reconstructed by iterative phase retrieval from a single CBED pattern.

Automated summary

In this study, we demonstrate how convergent-beam electron diffraction (CBED) can be used for atomic-precision imaging of individual defects in 2D materials. By combining structural calculations and density-functional theory, we present simulated CBED patterns and show how atomic positions can be reconstructed through iterative phase retrieval.