Journal
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 24, Issue 26, Pages 15951-15957Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/d2cp01697d
Keywords
-
Funding
- Russian Science Foundation [21-72-30029]
- Russian Science Foundation [21-72-30029] Funding Source: Russian Science Foundation
Ask authors/readers for more resources
Microstructural properties of beryllium and silicon in periodic multilayer mirrors Be/Si were comprehensively determined by Raman scattering, showing the evolution of Be structure from amorphous phase to polycrystalline phase with film thickness and the condensation of Si films into amorphous phase with nanocrystalline Si particles dispersed within.
Microstructural properties of the beryllium (Be) and silicon (Si) in periodic multilayer mirrors Be/Si with the variation of film thickness were comprehensively determined by Raman scattering. For the thinner films, the structure of Be evolved in the amorphous phase, and it was transformed into the polycrystalline phase for thicker films. The Si films in the periodic structure were condensed into the amorphous phase. The small fraction of nanocrystalline Si particles was distributed within the amorphous phase. A shake-up satellite peak of Si 2s photoelectrons was observed in X-ray photoelectron spectroscopy which suggested the excitation of a plasmon in Si films embedded within Be/Si periodic multilayers. The energy of plasmons was sensitive to the film thickness of Si in the periods which directly corresponds to the particle size. The binding energy of the satellite peak of Si 2s photoelectrons was blueshifted (higher energy) with a decrease in the particle size. This was explained by size dependent quantum confinement of particles.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available