4.6 Article

Relationship between the parent charge transfer gap and maximum transition temperature in cuprates

Journal

SCIENCE BULLETIN
Volume 61, Issue 23, Pages 1826-1832

Publisher

ELSEVIER
DOI: 10.1007/s11434-016-1204-x

Keywords

Cuprates; Mott insulator; Charge transfer gap; Maximum transition temperature; Scanning tunneling microscopy

Funding

  1. National Natural Science Foundation of China
  2. Ministry of Science and Technology of the People's Republic of China
  3. Chinese Academy of Sciences [XDB07020300]

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One of the biggest puzzles concerning the cuprate high temperature superconductors is what determines the maximum transition temperature (T-c,T-max), which varies from less than 30 to above 130 K in different compounds. Despite this dramatic variation, a robust trend is that within each family, the double-layer compound always has higher T-c,T-max than the single-layer counterpart. Here we use scanning tunneling microscopy to investigate the electronic structure of four cuprate parent compounds belonging to two different families. We find that within each family, the double layer compound has a much smaller charge transfer gap size (Delta(CT)), indicating a clear anticorrelation between Delta(CT) and T-c,T-max. These results suggest that the charge transfer gap plays a key role in the superconducting physics of cuprates, which shed important new light on the high T-c mechanism from doped Mott insulator perspective.

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