Journal
INORGANIC CHEMISTRY FRONTIERS
Volume 9, Issue 16, Pages 4225-4231Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/d2qi00952h
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Funding
- NSFC [22178389, 21975285, 22175200, 21991090, 21991091]
- IRN Zeolites
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In this work, low-voltage field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectroscopy (EDS) analyses were used to investigate zeolite structures. Low-voltage electron imaging was applied to visualize the surface structures of ZSM-5 zeolites and cross-sectional imaging techniques were used to reveal sub-surface etching of SAPO-34 zeolites. The study also demonstrated the presence of hidden macropores introduced by NH4F etching and recorded the near-surface-layer element distribution in zeolite crystals through combined low-voltage imaging and EDS analysis.
In this work, low-voltage field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectroscopy (EDS) analyses were applied for the investigation of zeolite structures. Low-voltage electron imaging was applied to visualize the surface structures of ZSM-5 zeolites with a mosaic surface morphology, and cross-sectional imaging techniques were used to show the sub-surface etching of SAPO-34 zeolites that cannot otherwise be directly revealed by SEM. In the case of SAPO-34 zeo-type crystals, the hidden macropores with a framed butterfly shape introduced by NH4F etching were revealed. In addition, the combined low-voltage imaging and EDS triple-detector analysis allowed recording of the near-surface-layer element distribution in the zeolite crystals; this was exemplified on SAPO-34 crystals during dissolution for the first time. The results showed that some inner parts of the SAPO-34 crystals are more vulnerable than the outermost shell of the crystals, which were preferentially removed during the NH4F etching.
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