4.6 Article

Influence of Si-Doping on 45 nm Thick Ferroelectric ZrO2 Films

Journal

ACS APPLIED ELECTRONIC MATERIALS
Volume 4, Issue 7, Pages 3648-3654

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsaelm.2c00608

Keywords

ferroelectric; antiferroelectric; zirconium oxide; Raman spectroscopy; stress; doping

Funding

  1. Deutsche Forschungs Gemeinschaft DFG (German Research Foundation) [433647091, 430054035]
  2. Deutsche Forschungs Gemeinschaft DFG [KE 1665/5-1]
  3. Saxonian State budget

Ask authors/readers for more resources

Si-doped ZrO2 thin films exhibit ferroelectric behavior and the ferroelectric properties can be modulated by Si dopants. The monoclinic and orthorhombic phases decrease, while the tetragonal phase increases with increasing Si-doping content in ZrO2 films. The ZrO2 films show antiferroelectric characteristics at room temperature and lower temperatures.
In the last decades, ferroelectricity has been discovered in Si-doped HfO2 and Hf(1-x)ZrxO(2) thin films, and the origin of ferroelectricity is considered to be the presence of the polar Pca(21) orthorhombic phase. Recently, some investigations suggest that ZrO2 thin films show ferroelectric behavior as well. As a well-known dopant capable of modulating ferroelectricity in HfO2 thin films, Si-doping is applied up to approximately 5.3% to modify the ferroelectric properties of ZrO2 films in this work. The atomic layer-deposited ZrO(2 )films with a 45 nm thickness shows ferroelectric behavior with a remanent polarization of 7 mu C/cm(2 )after post-metallization annealing at 800 degrees C. According to Raman spectroscopy and grazing incidence X-ray diffraction structural characterizations, the amount of monoclinic and orthorhombic phases decreases, and the presence of the tetragonal phase increases by increasing the Si-doping content in the ZrO2 films. The electrical properties both at room temperature and at lower temperature demonstrate antiferroelectric characteristics with lower remanent polarization and double hysteresis loops with Si incorporation in the 45 nm thick ZrO2 films. An extrapolation of the Curie temperature for different Si-doping concentrations is obtained based on temperature-dependent remanent polarization measurements, showing evidence that Si dopants destabilize the polar ferroelectric phase. An increasing in-plane tensile strain with more Si-doping aids in stabilizing the tetragonal phase and leads to an improvement of antiferroelectric properties in 45 nm thick ZrO2.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available