Structural Optimization Design and Analysis of M-Type Czerny-Turner Spectrometer

Aiming at the problem of secondary diffraction in aberration correction of an M-type Czerny-Turner spectrometer, we propose the anti-secondary diffraction condition for this optical structure under the coma-free condition. The main factors of secondary diffraction are analyzed and deduced theoretically. Combining the anti-secondary diffraction condition with the constraint coma-free condition, we built an M-type coma-free Czerny-Turner spectrometer. In order to verify the correctness of the theoretical analysis, the Zemax OpticStudio simulation software is used for a comparative experiment. The simulation results show that there is no secondary diffraction in the M-type optical path structure meeting the constraints, but there is secondary diffraction in the M-type optical path structure that does not meet the constraints, which is consistent with the theoretical analysis result. Under the condition that the incident slit width is 25 mu m and the grating engraving line density is 600 line/mm, the spectral resolution of the optical system optimized by the software is better than 1 nm in the range of 200-500 nm.

Automated summary

In this study, we propose an anti-secondary diffraction condition for the aberration correction of an M-type Czerny-Turner spectrometer and establish an M-type coma-free Czerny-Turner spectrometer. The correctness of the theoretical analysis is verified through simulation experiments, showing that the optimized optical system has a spectral resolution better than 1 nm in the range of 200-500 nm under specific conditions.