Journal
MRS COMMUNICATIONS
Volume 12, Issue 5, Pages 831-837Publisher
SPRINGER HEIDELBERG
DOI: 10.1557/s43579-022-00249-7
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Funding
- project MERIT [POCI-01-0145FEDER-028612]
- project CICECO-Aveiro Institute of Materials through the FCT/MEC (PIDDAC) [UIDB/50011/2020, UIDP/50011/2020, LA/P/0006/2020]
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By characterizing MgO-doped partially stabilized zirconia materials, the roles of different phase particles can be distinguished using XRD and thermal expansion data analysis, providing insights into their behaviors within the material.
MgO-doped partially stabilized zirconia (xMgPSZ, with x = 8 or 10 mol%) materials sintered at 1700 degrees C, were characterized with respect to structure, microstructure, thermal expansion and electrical performance. The monoclinic (M) phase content is almost vestigial in 10MgPSZ, unlike in 8MgPSZ. Combined powder XRD and customized thermal expansion data analysis, allowed a separation between M and tetragonal (T) particles, outside or imbedded in cubic grains. Combination of thermal expansion and impedance spectroscopy data provided novel insights on the totally distinct roles of fine and dispersed T or M particles within the PSZ cubic matrix grains.
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