4.6 Article

Beware of beam damage under reaction conditions: X-ray induced photochemical reduction of supported VOx catalysts during in situ XAS experiments

Journal

PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 24, Issue 36, Pages 21916-21926

Publisher

ROYAL SOC CHEMISTRY
DOI: 10.1039/d2cp02721f

Keywords

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Funding

  1. Swiss National Science Foundation (SNSF) [200021_179132]
  2. Swiss Light Source
  3. Swiss National Science Foundation (SNF) [200021_179132] Funding Source: Swiss National Science Foundation (SNF)

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In situ X-ray absorption spectroscopy is a powerful technique for investigating catalysts, but intense X-ray irradiation can induce changes in metal species and corresponding XAS spectra. This study found X-ray induced photochemical reduction in catalysts and suggests approaches to mitigate this effect.
In situ X-ray absorption spectroscopy (XAS) is a powerful technique for the investigation of heterogeneous catalysts and electrocatalysts. The obtained XAS spectra are usually interpreted from the point of view of the investigated chemical processes, thereby sometimes omitting the fact that intense X-ray irradiation may induce additional transformations in metal speciation and, thus, in the corresponding XAS spectra. In this work, we report on X-ray induced photochemical reduction of vanadium in supported vanadia (VOx) catalysts under reaction conditions, detected at a synchrotron beamline. While this process was not observed in an inert atmosphere and in the presence of water vapor, it occurred at room temperature in the presence of a reducing agent (ethanol or hydrogen) alone or mixed with oxygen. Temperature programmed experiments have shown that X-ray induced reduction of VOx species appeared very clear at 30-100 degrees C but was not detected at higher temperatures, where the thermocatalytic ethanol oxidative hydrogenation (ODH) takes place. Similar to other studies on X-ray induced effects, we suggest approaches, which can help to mitigate vanadium photoreduction, including defocusing of the X-ray beam and attenuation of the X-ray beam intensity by filters. To recognize beam damage under in situ/operando conditions, we suggest performing X-ray beam switching (on and off) tests at different beam intensities under in situ conditions.

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