Journal
2020 20TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS 2020)
Volume -, Issue -, Pages 178-185Publisher
IEEE
DOI: 10.1109/RADECS50773.2020.9857706
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This study compares the susceptibility to Single Event Effects (SEE) of different commercial power MOSFET references under various energy and particle irradiation conditions through irradiation tests.
This work compiles the outcome of several irradiation test campaigns, carried out with the aim of studying the susceptibility to hard Single Event Effects (SEE) of various commercial power MOSFET references. Proton, neutron and heavy ion irradiation were performed on the same set of MOSFET references, allowing for a comparison of their respective Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR) sensitiveness under different energy and particle irradiation conditions.
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