Grain Size Prediction and Growth Thermo-Kinetics Analysis During Annealing with Different Heating Rates for High-Voltage Anode Aluminum Foil

Based on electron backscattered diffraction (EBSD) and grain growth model of thin film materials, grain sizes and growth thermo-kinetics were investigated during annealing with different heating rates in high-voltage anode aluminum foil. Results show that the grain growth exponent n=4, activation energy Q(g)=129 kJ/mol and rate constant K=1.28x10(-8)m(4)center dot s(-1) are calculated by the typical isothermal grain growth equation. Based on grain growth model of thin film materials and energy anisotropy, the reasons for the rapid growth of (001) oriented grains are well explained, and a typical 40 degrees < 111 > misorientation relationship with S-grains is found.

Automated summary

Based on electron backscattered diffraction and grain growth model, this study investigates the grain sizes and growth thermo-kinetics of high-voltage anode aluminum foil during annealing with different heating rates. The results provide the grain growth exponent, activation energy, and rate constant, and explain the rapid growth of (001) oriented grains.