3.8 Proceedings Paper

Electrical Performance Improvement of All-solution Processed Indium Zinc Oxide Thin-Film Transistor by UV-irradiation Treatment

This research aims to improve the electrical performance of all-solution processed amorphous Indium Zinc Oxide (a-IZO) thin-film transistor (TFT) by varying the duration of photo-assisted treatment. The experimental results showed that TFTs subjected to 90 minutes of UV-combination treatment achieved the optimum value with the highest mobility.
All-solution process for thin-film transistor (TFT) is promising due to its simple fabrication and low temperature enabling the use of flexible substrates. We successfully fabricated all-solution processed amorphous Indium Zinc Oxide (a-IZO) TFT. This research aims to improve the electrical performance of a-IZO TEl by varying the duration of photo-assisted treatment (Ultraviolet (UV) irradiation combined with low-heating treatment). Electrical performance of a-IZO TEl was enhanced by varying the UV-irradiation time combined with low heating treatment (115 degrees C). As a result, TFTs subjected to UV-combination treatment at 90 min reached the optimum value with highest mobility-, corresponding to the highest oxygen vacancy with optiiniun metal-oxide bonds.

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