Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

This report aims to fully describe the experimental technique of using ellipsometry for cooling rate dependent T-g (CR-T-g) experiments. These measurements are simple high-throughput characterization experiments, which can determine the glass transition temperature (T-g), average dynamics, fragility and the expansion coefficient of the super-cooled liquid and glassy states for a variety of glassy materials. This technique allows for these parameters to be measured in a single experiment, while other methods must combine a variety of different techniques to investigate all of these properties. Measurements of dynamics close to T-g are particularly challenging. The advantage of cooling rate dependent T-g measurements over other methods which directly probe bulk and surface relaxation dynamics is that they are relatively quick and simple experiments, which do not utilize fluorophores or other complicated experimental techniques. Furthermore, this technique probes the average dynamics of technologically relevant thin films in temperature and relaxation time (T-alpha) regimes relevant to the glass transition (T-alpha > 100 sec). The limitation to using ellipsometry for cooling rate dependent T-g experiments is that it cannot probe relaxation times relevant to measurements of viscosity (T-alpha << 1 sec). Other cooling rate dependent T-g measurement techniques, however, can extend the CR-T-g method to faster relaxation times. Furthermore, this technique can be used for any glassy system so long as the integrity of the film remains throughout the experiment.