Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 71, Issue -, Pages -Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2022.3216679
Keywords
Confocal chromatic sensor (CCS); opto-mechatronic system; range extension; surface metrology
Funding
- Christian Doppler Research Association
- Austrian Federal Ministry for Digital and Economic Affairs
- National Foundation for Research, Technology and Development
- ATENSOR Engineering and Technology Systems GmbH
- Micro-Epsilon Messtechnik GmbH Company KG
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This article presents a strategy to overcome the tradeoff between the thickness measuring range and lateral imaging resolution of a confocal chromatic sensor (CCS) by combining it with a linear stage. The proposed mechatronic approach successfully extends the measuring range by a factor of 17 while preserving the lateral resolution for thickness measurements. The proposed measurement scheme is validated by measuring lateral surface features on a 1.2-mm-thick lenslet array from the backside.
This article presents a strategy to break the tradeoff between the thickness measuring range of a confocal chromatic sensor (CCS) and its lateral imaging resolution. By combining the sensor with a linear stage, the thickness measuring range is no longer limited by chromatic dispersion, but by the focusing power of the sensor optics. The principle is demonstrated with a prototype setup that utilizes a CCS with a spot size of 6 mu m and a spec-sheet thickness measuring range of 300 mu m. By implementing the proposed mechatronic approach, a successful extension of the measuring range by a factor of 17 is achieved while preserving the lateral resolution of 2.46 mu m for thickness measurements. The proposed measurement scheme is validated by measuring lateral surface features on a 1.2-mm-thick lenslet array from the backside.
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