4.6 Article

A Process-Based Temperature Compensated On-Chip CMOS VHF VCRO in 130-nm Si-Ge BiCMOS by Implementing an Empirical Control Equation

Journal

IEEE ACCESS
Volume 10, Issue -, Pages 128664-128669

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/ACCESS.2022.3227566

Keywords

temperature compensation; process compensation; voltage-controlled-ring-oscillator; circuit design; VHF; radio-frequency; water-bath; Analog CMOS circuits

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This paper presents a low-power CMOS temperature and process compensated 150.9 MHz VHF voltage-controlled-ring-oscillator (VCRO) for on-chip integration. The design uses a temperature sensor and feedback control circuitry to generate the internal control voltage for the VCRO, ensuring oscillation at the desired frequency despite temperature variations. Simulation results demonstrate that the proposed design maintains the oscillator's frequency within 0.39% from -10 ? to 90 ?.
This paper presents a low-power CMOS temperature and process compensated 150.9 MHz Very-high-frequency (VHF) voltage-controlled-ring-oscillator (VCRO) for on-chip integration. The design employs a CMOS temperature-sensor and novel feedback control circuitry to generate the internal control-voltage for the VCRO which ensures oscillation in the vicinity of the desired frequency despite variations in temperature. The control circuitry is the implementation of an empirical equation expressing a temperature sensor-voltage into a specific control-voltage for three different process corners using three different switches. The control-voltage calibrates against temperature variation for the specific process-corner in order to maintain the same frequency of oscillation. Simulations shows that the proposed design maintains the oscillator's frequency within 0.39% from -10 ? to 90 ?. The fabricated chip implemented in 130-nm GF 8HP Si-Ge BiCMOS process, occupies an area of 0.0242-mm(2) and consumes 325 mu W while operating with a 1 V supply-voltage. The performance was verified through experimental immersion of DUT (device-under-test) in a temperature-controlled water-bath in the range 22.5 ?-70 ?.

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