4.1 Article

A mixed XFEM and CZM approach for predicting progressive failure in advanced SiC/SiC CMC component

Journal

COMPOSITES PART C: OPEN ACCESS
Volume 9, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.jcomc.2022.100325

Keywords

SiC/SiC CMC; FEM; XFEM; CZM; 1st cracking; Delamination

Funding

  1. Japan Science and Technology Agency, JST

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This research work focuses on simulating different fracture modes in the high-stress concentrated region of SiC/SiC CMC components at the macroscopic scale, considering the increasing cost and time of experimental tests. XFEM and CZM are used to predict mode-I and mode-II fracture behavior, respectively. The results show that the first crack initiation and propagation are dependent on XFEM damage criteria, and delamination occurs at the damage-front CE layers. The simulated force-displacement relationships match well with experimental results, indicating that XFEM with CZM methodology can be a reliable method for predicting fracture behavior in complex-shaped SiC/SiC CMC components in the near future.
This research work focused on simulating different fracture modes in the high-stress concentrated region of an advanced SiC/SiC CMC component at the macroscopic scale in consideration of increasing cost and time during experimental tests of CMCs. A hybrid of extended-finite-element-method (XFEM) and cohesive-zone-modeling (CZM) was utilized to predict mode-I and mode-II fracture behavior, respectively. The cohesive element (CE) layers were used as fiber-tow interfaces in the stress-concentrated region where mode-II failure was supposed to occur. The 1st crack initiation and its further propagation were found to be dependent on XFEM damage criteria, whereas delamination was observed at the damage-front CE layers. The simulated force-displacement relationships were compared with the experimental ones, where stiffness and serrations in the force-displacement curve corresponding to the delamination matched quite well. With concern to predicting the fracture behavior in a complex-shape component of SiC/SiC CMCs, XFEM with CZM methodology can be a reliable method in the near future.

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