Journal
PHYSICAL REVIEW A
Volume 106, Issue 5, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevA.106.052416
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Funding
- John Templeton Foundation
- [APVV-18-0518]
- [VEGA 2/0183/21]
- [JTF-61466]
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In this study, we investigate the robustness of a probabilistic storage and retrieval device optimized for phase gates to noise. We find that the device exhibits higher resistance to dephasing noise compared to depolarization noise. Interestingly, we observe that the retrieval process reduces the degree of noise for depolarization. Additionally, we examine different possible realizations of the device and observe differences in their performance in the presence of noise.
We investigate robustness of probabilistic storage and retrieval device optimized for phase gates to noise. We use noisy input composed of convex combination of unitary channel with either depolarizing or dephasing channel. We find out that the resistance to dephasing noise is higher than to depolarization. Interestingly, for the depolarization the retrieval reduces the degree of noise. We also examine the possible realizations showing that their performance is different when the noise is present.
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