3.8 Proceedings Paper

Dual-binary phase gratings for x-ray interferometry

Journal

DEVELOPMENTS IN X-RAY TOMOGRAPHY XIV
Volume 12242, Issue -, Pages -

Publisher

SPIE-INT SOC OPTICAL ENGINEERING
DOI: 10.1117/12.2643914

Keywords

Talbot interferometry; X-ray phase-contrast; Grating design

Funding

  1. Swedish Research council [2014-6054]

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Multiple binary structures in the phase grating can be simulated to utilize Moire effects and achieve phase-contrast imaging without the use of attenuating grating structures.
X-ray phase-contrast imaging by grating interferometry has in the past decades been established both at synchrotron radiation sources and at conventional x-ray tubes. Due to the sensitivity to x-ray phase shifting, contrast in soft tissue has been improved significantly and the possibilities to do virtual histology of tissue biopsies are being pioneered. Constraints in the design of a grating interferometer are dominated by the phase-shifting structures of the gratings. Typically, binary gratings are used, with alternating regions of shift and no shift. However, other structures are also possible, leading to different patterns of intensity modulations. Here we simulate the possibility of using multiple binary structures in the phase grating, to utilize Moire effects and avoid the use of attenuating grating structures. In particular the parameters for grating-based phase-contrast imaging using a single optical element are discussed, with focus on laboratory-based x-ray imaging using microfocus sources.

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