Journal
2022 IEEE PHYSICAL ASSURANCE AND INSPECTION OF ELECTRONICS (PAINE)
Volume -, Issue -, Pages 141-145Publisher
IEEE
DOI: 10.1109/PAINE56030.2022.10014786
Keywords
Data reduction; Dynamic Data Reduction; UMAP
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In this study, we aim to reduce the computational time and improve model accuracy by using dynamic data reduction techniques on moderately complex datasets, thereby mitigating the environmental impact of deep learning models.
We perform experiments using dynamic data reduction on datasets of moderate complexity, with focus on classification of a Micro-PCB image dataset. As deep learning models increase in complexity, the data that they use increases at a rate we can't keep up with. The result of this is often slight improvements to the model's accuracy, at the improportional cost of computational runtime, which increases the electricity used, and ultimately carbon emissions. By using data reduction techniques, we attempt to identify the least critical data to be excluded from training, which in turn cuts the environmental cost. We show the effect of data reduction techniques on moderately complex image data, including PCB images, to reduce runtime by 2% and improve the accuracy by 0.013%.
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