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Probing charge density in materials with atomic resolution in real space

Journal

NATURE REVIEWS PHYSICS
Volume 5, Issue 2, Pages 117-132

Publisher

NATURE PORTFOLIO
DOI: 10.1038/s42254-022-00541-4

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This article discusses the developments in high-resolution real-space charge distribution imaging using diffraction techniques and electron microscopy, focusing on the recent advancement of four-dimensional scanning transmission electron microscopy, electron holography, and applications to materials interfaces.
The charge distribution in materials at the nanoscale can often explain the origin of macroscopic properties such as localized conductivity or the plasmonic response and illuminate more fundamental changes in the microscopic structure such as changes in chemical bonding characteristics. Previously, direct visualization of the charge density with high spatial resolution was often a missing link in the formation of structure-property relationships, especially in heterogeneous materials systems. However, recent advancements in microscopy technology have enabled researchers to visualize the charge distribution in materials down to subatomic length scales. In this Technical Review, we discuss the developments in high-resolution real-space charge distribution imaging using diffraction techniques and electron microscopy, with a focus on the recent advancement of four-dimensional scanning transmission electron microscopy, electron holography, and applications to materials interfaces.

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