Journal
RADIATION PHYSICS AND CHEMISTRY
Volume 213, Issue -, Pages -Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.radphyschem.2023.111208
Keywords
Heavy ion PIXE; Multiple ionisation; X-ray production; ECPSSR; Ion beam analysis
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Particle Induced X-ray Emission (PIXE) spectroscopy is a well-established analytical technique, especially for low projectile mass. The availability of accurate theoretical models is crucial for the development of PIXE. This study aims to contribute to the database of heavy ion induced X-ray production cross sections by providing new experimental data.
Particle Induced X-ray Emission (PIXE) spectroscopy is an effectively well-established analytical technique in the low projectile mass (Z < 3) regime. This is in part due to the availability of fairly accurate theoretical models of fundamental interaction parameters such as the X-ray production cross section (XPCS). Continual development of widely used theoretical models such as the ECPSSR theory with adapted corrections in the United Atom limit (UA), Electron Capture (EC) and Multiple Ionisation (MI); requires a rich database of experimental X-ray pro-duction cross sections. Beyond the scope of proton PIXE, validated reliable theoretical models may be useful for the accurate approximation of heavy ion induced X-ray production cross sections for Heavy Ion PIXE. This re-quires persistent efforts aimed at contributing to the currently sparse heavy ion induced X-ray production cross section database. In this work, we report on a new experimental dataset of low energy XPCS in the 0.3 MeV/u - 1.0 MeV/u ion velocity range in Cr, Ni, Ge, Mo, Sn, W, Au and Bi due to proton and Si-28(q+) ion impact, with an aim at enriching and updating the current database.
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