Nanosized antiferromagnetic domains in NiO/Ag(001) films probed by polarised X-ray and unpolarised low-energy electrons

Surface antiferromagnetism of NiO film, epitaxially deposited on Ag(001), is investigated using the absorption of linearly polarised X-ray and the diffraction of low-energy unpolarised electrons. Polarisation-dependent X-ray absorption studies reveal a preferential stabilisation of the magnetic domains with the main components of magnetic axes parallel to the interface. Furthermore, the role of interfacial strain-induced magnetocrystalline anisotropy below a critical film thickness (similar to 20 ML) could be demonstrated by the magnetic linear dichroism results. Utilising the exchange scattered electrons from various antiferromagnetic (111) planes, the magnetic twin domains could be probed by a low energy electron microscope operating in the dark-field mode. The linearly polarised X-ray, on the other hand, is sensitive to the magnetic axes orientations of Ni2+ ions and therefore, provides access to the spin domains as well as the twin domains. Comparison of results of these two independent imaging techniques demonstrates that the in-plane component of the magnetic easy axes contained by the complementary T-domains are parallel to each other.

Automated summary

Surface antiferromagnetism of NiO film on Ag(001) is investigated using X-ray absorption and electron diffraction techniques. The study reveals a preferential stabilisation of magnetic domains with the magnetic axes parallel to the interface. Comparison of two imaging techniques shows that the in-plane component of the magnetic easy axes in complementary T-domains are parallel to each other.