Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 72, Issue -, Pages -Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2023.3309398
Keywords
Optical measurement; polarization coded; structured light
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The fringe projection profilometry (FPP) method is extensively studied and used for its high precision and good noise resistance. However, most metal products in practical 3-D measurement applications do not have ideal Lambertian surfaces, and using too many projected patterns complicates the application while improving robustness. In this paper, we propose a polarization code-multiplexed phase shift (PMPS) method that uses the polarization state of light for encoding and robustly unwraps the phase with complementary gray-code information in the polarization fringe patterns. Compared to traditional methods, the PMPS method can efficiently and robustly reconstruct metallic objects with half the number of projected patterns in the presence of ambient light.
The fringe projection profilometry (FPP) method is intensively studied and widely used for its high precision and good antinoise ability. In practical 3-D measurement applications, most metal products do not have the ideal Lambertian surfaces. In addition, too many projected patterns complicate the application of such strategies while improving robustness. We propose a polarization code-multiplexed phase shift (PMPS) method to overcome the above challenges. Our method uses the polarization state of light to assist encoding. The phase is robustly unwrapped with complementary gray-code information in the polarization fringe patterns. Compared with the traditional methods, the PMPS method can efficiently and robustly reconstruct metallic objects under the influence of ambient light with half the number of projected patterns.
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