Journal
ADVANCED OPTICAL MATERIALS
Volume 5, Issue 3, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adom.201600768
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Funding
- Singapore MOE [MOE2011-T3-1-005, MOE Tier 1 M401040000]
- EPSRC (U.K.) [EP/M009122/1]
- Australian Research Council, ARC Centre of Excellence-FLEET
- Engineering and Physical Sciences Research Council [EP/M009122/1] Funding Source: researchfish
- EPSRC [EP/M009122/1] Funding Source: UKRI
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Phase-resolved real-space imaging of localized plasmons in Bi1.5Sb0.5Te1.8Se1.2 topological insulator nanostructures is performed by scattering-type scanning near-field optical microscopy. Dipolar and higher order surface plasmon modes with well-defined field amplitude and phase profiles are detected in the visible part of the spectrum.
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