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ELSEVIER
DOI: 10.1016/j.nima.2023.168830
Keywords
Pump-and-probe; Split-and-delay line; X-ray free electron lasers
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In this work, the X-ray Tomographic dElay Line (XTEL) is introduced as an optical system for studying dynamics of mesoscale materials processes with X-ray light sources. The XTEL was tested on the MFX instrument and showed stable performance over multiple days. Additionally, a conceptual design for an XTEL-like optic with delays in the picosecond range is presented.
In this work, we describe an X-ray pump/X-ray probe delay line with limited view tomographic capability, called X-ray Tomographic-dElay-Line (XTEL). This optical system is designed for studying pico-to nanosecond dynamics of mesoscale materials processes at existing X-ray light sources. The XTEL was built in a 1-beam configuration and was tested on the Macromolecular Femtosecond Crystallography (MFX) instrument at the Linac Coherent Light Source (LCLS). The relative intensity of the probe vs. pump beam was measured to be 0.4% +/- 0.1% and the instrument pointing was stable to within the rocking curve width of the crystal optics over multiple days. We also show the conceptual design for an XTEL-like optic with delays in the picosecond range, enabling the study of diffusion in the warm dense matter regime.
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