Journal
JOURNAL OF POLYMER SCIENCE
Volume -, Issue -, Pages -Publisher
WILEY
DOI: 10.1002/pol.20230720
Keywords
density fluctuation ridge; neutron reflectivity; polymer thin films; star polymers; supercritical carbon dioxide; swelling; x-ray reflectivity
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The impact of polymer chain architecture on the swelling of polymer thin films in the presence of supercritical CO2 was investigated. The results showed that star polymers behave similarly to linear polymers in terms of swelling, but exhibit less swelling at smaller film thicknesses.
Impact of polymer chain architecture on the swelling of supported single-layer polymer thin films with thicknesses below 80 nm in the presence of supercritical CO2 (scCO2) is investigated using in-situ neutron reflectivity (NR) and ex-situ x-ray reflectivity (XR). 4-arm star and 8-arm star deuterated polystyrene (dPS) having similar total molecular weights are used. NR results revealed that the magnitude of the swelling for star polymers increases proportionally with decreasing dry film thicknesses similar to linear polymers. For film thicknesses above 5Rg, architectural differences have no impact on the swelling behavior. However, below 5Rg as the branching increases from linear to 4-arm star and to 8-arm star, swelling decreases due to the presence of a relatively thicker adsorbed layer formed by more branched architectures. Ex-situ XR measurements verified that star architectures swell less than linear architecture and provided new information about the vitrification of the films through rapid quenching and its relation to the amount of CO2 retention. image
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