Analytical deconvolution of smearing effect for inversion of scanning mobility particle sizer data

The scanning mobility particle sizer (SMPS) is a key instrument for aerosol studies that enables rapid measurement of particle size distribution. When SMPS data are inverted, the smearing effect needs to be considered. Previous studies used numerical methods to deconvolute the smearing effect. In this paper, to reduce the complexity of SMPS data inversion, we derive an analytical formula for de-smearing, and include our desmearing formula into a full SMPS data inversion scheme. We also propose the voltage step change experiment to characterize the smearing effect of an SMPS. The effectiveness and robustness of our de-smearing approach were demonstrated using experimental data.

Automated summary

In this study, a new de-smearing method is proposed to reduce the complexity of SMPS data inversion. An analytical formula is derived and included in a full SMPS data inversion scheme. The smearing effect of an SMPS is characterized through voltage step change experiment. The effectiveness and robustness of the de-smearing approach are demonstrated using experimental data.